SERMA Technologies offers a wide range of services in microstructures analyses for EEE parts up to the atomic scale:
-Optical microscopes with digital camera (1600x1200 pixels) and Axon software (Newtec)
Scanning Electron Microscopy (SEM) allows to obtain chemical and textural information (conventional and high resolution SEM coupled to EDX analysis).
-MEB ZEISS Gemini 1530 - SE and BSE detectors; EDX
-MEB ZEISS Gemini Ultra 55 - SE et BSE detectors; STEM; EDX
-MEB Hitachi 5500 – SE detectors; STEM; EDX
-Dual Beam STRATA 400 FEI equipped with a FIB column and a SEM column
-Dual Beam NVISION 40 ZEISS equipped with a FIB column and a SEM column
Transmission Electron Microscopy (TEM) provides information on the texture (size, objects morphology, surface roughness and interfaces), structure (phases and crystalline orientations: electronic precession) and composition (X signal analysis by EDX, energy losses EELS).
-TEM TECNAI G2 F20 S-TWIN from FEI - 200kV; STEM BF and HAADF; EDX
-TEM TECNAI OSIRIS from FEI - 80kV à 200kV; STEM BF, DF2, DF4, and HAADF; EELS filter (Type GIF); EDX (4
Super-X detectors with SDD technology)
-TEM JEOL JEM-2010FEF - 200kV; STEM BF and HAADF; ASTAR system; EELS filter (Type Ω)
Getting access to information about the physico-chemical mechanisms is critical determining the root cause of a failure such as corrosion, adhesion, oxidation, diffusion, implantation, strain…
SERMA Technologies services at a glance: failure analysis, dimensional analysis, crystallographic analysis, elemental analysis, 3D visualization of a micrometric object.